LID Less Socket for Semiconductors
Optimal for optical testing, achieving high speed with a lidless structure.
In the semiconductor industry, the acceleration of image sensors and other technologies is progressing, increasing the importance of optical testing. In traditional socket structures, the pressurized LID can hinder the entry of light, potentially obstructing accurate measurements. The LID Less Socket ensures conductivity by attracting the package from the backside in a vacuum and distorting the contactor. Without a pressurized LID, light intake becomes unrestricted, contributing to faster speeds. 【Usage Scenarios】 - Measurement of image sensors - Evaluation of optical characteristics - Testing of semiconductor devices requiring high-speed data transfer 【Benefits of Implementation】 - Improved accuracy of optical testing - Greater design flexibility for sockets - Potential cost reduction
- Company：JMT
- Price：Other
